Other publications

• U M Bhatta, I M Ross, D Sayle, T Sayle, D Reid, S Seal, G. Möbus
  Surface activity assessment on CeO2 nanocrystals using electron beams as probes
  Proceed. Europ.Microsc.Congr., Manchester 1 (2012)

• G. Möbus, W. Xie, S. Zhang
  A concept for electron induced X-ray emission tomography (EIXE-T)
  Proceed. Europ.Microsc.Congr., Manchester 1 (2012)

• W. Guan, G. Möbus, P. Hatton, W. Austin, E. Lester
  3D Reconstruction of Hydroxiapatite Nanoparticles and Plates
  Proceed. Europ.Microsc.Congr., Manchester 1 (2012)

• T. Gnanavel, J. Ghatak, G. Möbus
  Time resolved observation of in situ nanoparticle synthesis in 2D and 3D
  Proceed. Europ.Microsc.Congr., Manchester 1 (2012)

• W Guan, I M Ross, U M Bhatta, N Peng, G. Möbus
  Co and Pt implantation through nanoporous masks observed by aberration-corrected STEM and spectrum imaging
  Proceed.Europ.Microsc.Congr., Manchester 1 (2012)

• W. Guan, G. Möbus, C. Hill, P. Hatton, W. Austin, E. Lester, N. Botterill, D. Grant
  Nanometrology of hydroxiapatite nanostructures via tomography
  Microscopy and Microanalysis 18 Issue S2, (2012)

• T. Gnanavel, J. Ghatak, G. Möbus
  In-situ Nanoparticle Nucleation And Growth With Tomographic Monitoring
  Microscopy and Microanalysis 18 Issue S2, (2012)

• W. Guan, U. Bhatta, N. Peng, I.M. Ross, J. Ghatak, G. Möbus
  Co-Clustering Via Nanochannel-Membrane Modulated Ion Implantation into Si3N4 Observed By Plan-View Aberration-Corrected STEM And EELS.
  Microscopy and Microanalysis 18 Issue S2, (2012)

• Günter Möbus, T. Gnanavel,
  Tomographic nanofabrication with electron beams
  Proceed. Microscopy Congress (MC2011) Kiel, Germany (2011)

• W. Guan, Günter Möbus
  Differential tilt between two specimen parts by an all piezo-electric miniaturised goniometer
  Proceed. Microscopy Congress (MC2011) Kiel, Germany (2011)

• Günter Möbus, Z. Saghi , U.M. Bhatta, I.M. Ross
  Aberration corrected TEM of irradiation induced atomic hopping processes on various ceria surfaces observed in-situ
  Proceed. Microscopy Congress (MC2011) Kiel, Germany (2011)

• G Möbus, Z Saghi and W Guan
  Surface Plasmon Electron Tomography Viewed as an Inverse Hough Transform
  Microscopy and Microanalysis 16 Issue S2, 852 - 853 (2010)

• G Möbus,
  A Simple Autofocus Technique for Aberration Corrected TEM
  Microscopy and Microanalysis 16 Issue S2, 164-165 (2010)

• W Guan, A Lockwood, BJ Inkson, G Möbus,
  A Piezoelectric Goniometer Inside a TEM Goniometer
  Microscopy and Microanalysis 16 Issue S2, 1784-1785 (2010)

• G Möbus and Z Saghi,
  Single Atom Motion on CeO2 Nanoparticle Surfaces Imaged by Aberration Corrected HRTEM
  Microscopy and Microanalysis 16 Issue S2, 1452 -1453 (2010)

• Z. Saghi, G Möbus,
  Quantitative Evaluation of Atom Motion on CeO2 Nanoparticle Surfaces Using Aberration-corrected HRTEM.
  Proceed. IMC17, Rio de Janeiro, Brasil, 1, in press (2010)

• M Ojovan, G Möbus, J. Tsai, S. Cook, G Yang,
  On fluidisation of silicate glasses in intense radiation fields
  Proceed. ICEM2009, 12th International Conference on Environmental Remediation and Radioactive Waste Management in press (2009)

• Z. Saghi, X. Xu and G. Möbus
  Multi-mode electron tomography for the 3D morphological and structural characterization of nanomaterials
  Proceed. Microscopy Congr. 2009 (2009).

• D Devaprakasam, PV Hatton, G Moebus, BJ Inkson,
  Nanomechanical and nanotribological properties of nano- and microparticle filled polymer composites used for dental restorative applications
  PROCEEDINGS OF THE ASME/STLE INTERNATIONAL JOINT TRIBOLOGY CONFERENCE, PTS A AND B 821-825 (2008)

• X. Xu, A. Lockwood, R. Gay, Z. Saghi, J.J. Wang, Y. Peng, B. J. Inkson and G. Möbus
  Tomography Unlimited: A full tilt range goniometer inside a TEM goniometer
  Proceed. EMC2008, Aachen, I , 315-316, (2008)

• Z. Saghi, X. Xu, G. Möbus
  EELS fine structure tomography using spectrum imaging
  Proceed. EMC2008, Aachen, I , 427-428, (2008)

• Z. Saghi, X. Xu, G. Möbus
  Three-dimensional HREM Structure Retrieval
  Proceed. EMC2008, Aachen, I , 149-150, (2008)

• Z. Saghi, X. Xu, G. Möbus
  Quantification of Nanoparticle Tomograms
  Proceed. EMC2008, Aachen, I , 333-334, (2008)

• T. Gnanavel, Z. Saghi, Y. Peng, B.J. Inkson, M.R.J. Gibbs, G. Möbus
  Nanofabrication of ferromagnetic nanotips and nanobridges by 2D and 3D electron-beam cutting
  Proceed. EMC2008, Aachen, II , 599-600, (2008)

• G. Möbus, J. Tsai, X.J. Xu, P. Bingham, G. Yang
  Nanobead Formation and Nanopatterning in Glasses
  Microscopy&Microanalysis, Proceed. M&M2008 14(S2) , 434-435, (2008)

• G. Möbus, J. Tsai
  Nanopatterning and Grain Growth in Fluorides
  Microscopy&Microanalysis, Proceed. M&M2008 14(S2) , 248-249, (2008)

• T. Gnanavel, Z. Saghi, Y. Peng, G. Möbus
  Nanofabrication by 3D E-beam Cutting
  Microscopy&Microanalysis, Proceed. M&M2008 14(S2) , 460-461, (2008)

• X. Xu, Z. Saghi, G. Möbus
  3D Metrology of Nanoparticles by Tomogram Processing
  Microscopy&Microanalysis, Proceed. M&M2008 14(S2) , 592-593, (2008)

• M. A. Mat Yajid, T. Wagner, G. Möbus
  Plasmon Resonance Chemical Phase Mapping of Reactive Multilayers
  Microscopy&Microanalysis, Proceed. M&M2008 14(S2) , 1362-1363, (2008)

• Z. Saghi, X. Xu, Y. Peng, B. J. Inkson, G. Möbus
  Chemical Analysis of Tungsten Tips by EDX Line Scan Tomography
  Proceed. DGE2007, Saarbrücken, ,in press, (2007)

• Z. Saghi, X. Xu, Y. Peng, B. J. Inkson, G. Möbus
  The Information Content of Tomograms of Nanoparticles
  Proceed. DGE2007, Saarbrücken, ,in press, (2007)

• Z. Saghi, X. Xu, G. Möbus
  3D Reconstruction of SPM Probes by Electron Tomography
  J. Phys.: Conf. Ser. 61 , 810-814, (2007)

• Y. Peng, X. Xu, G. Möbus, R. Gay, A.G. Cullis, B.J. Inkson
  Morphology of Shape-Controlled Ultra-Sharp Tungsten Tips
  Proceed. 16th Int.Microscopy Congress, Sapporo, Japan, 2, 862, (2006)

• G. Yang, R. Hand, G. Möbus,
  ELNES Linescan and Tomography Studies of Glasses and Glass Nanocomposites
  Proceed. 16th Int.Microscopy Congress, Sapporo, Japan, 2, 1773, (2006)

• G. Möbus,S. Al-Bermani, X. Xu, Z. Saghi, Y. Peng, R. Gay
  3D Reconstruction of Nanostructures from Incomplete Data
  Proceed. 16th Int.Microscopy Congress, Sapporo, Japan, 2, 949, (2006)

• T. Gemming, S. Gemming, G. Möbus
  HRTEM Image Calculations of Ionic and Hot Materials based on First-Principles and Molecular-Dynamics Simulated Structures
  DFTEM 2006 - bringing together two communities - International Conference on Density Functional Theory and Transmission Electron Microscopy, Ed. J. Luitz et al., p.41-44, April 2006, Vienna / Austria; ISBN 3-902548-00-2

• X. Xu, Z. Saghi, Y. Peng, R. Gay, B.J. Inkson, G. Möbus,
  Electron Tomography of Tungsten Tips by Coherent and Incoherent Imaging Modes of TEM/STEM
  Microscopy and Microanalysis, 12, S02, 648-649, (2006)

• G. Yang, G. Möbus,R.J. Hand
  Fine structure EELS analysis of glasses and glass composites
  J Phys Conf Series 26, 73-76, (2006)

• G. Möbus, P. Vukusic and J.R. Sambles
  Natural Grain Boundaries Over 3 Orders of Magnitude: Atomic vs. Bio-Photonic (Poly-) Crystals Examined by TEM.
  Microscopy & Microanalysis, 10 (Suppl 2), 4-5, (2004).

• G. Möbus, R. Short and R.J. Hand.
  Analytical TEM Studies of Borosilicate Glasses.
  Microscopy & Microanalysis, 10 (Suppl 2), 796-798, (2004).

• G. Möbus, B.J. Inkson, I.M. Ross, and R. Morrison.
  Unlimited Tilt for Ultra-Narrow Lenses: Tomography at Highest Resolution?
  Microscopy & Microanalysis, 10 (Suppl 2), 1196-1197, (2004).

• Michael Ojovan, Guenter Moebus, Natalie Ojovan, Cameron McLeod, Alan Cox
  Surface structure of corroded nuclear waste glasses
  Proc. Laser Ablation Workshop, Sheffield, Roy.Soc.Chem., in press, (2004).

• G. Möbus, B.J. Inkson, I.M. Ross, J.M. Rodenburg, and B. Morrison.
  Analytical Electron Tomography for Ultra-Resolution Pole-Piece TEM.
  Proceed. EMC, Antwerp, in press, (2004).

• G. Möbus and A. Trampert.
  3D Display and Analysis of Strain Fields at Heterointerfaces.
  Microscopy & Microanalysis, 9 , Suppl02, 746-747 (2003)

• G. Möbus and B.J. Inkson.
  Novel Nanoscale Tomography Modes in Materials Science
  Microscopy & Microanalysis, 9 Suppl02, 176-177 (2003).

• B J Inkson, S Olsen, D J Norris, A G O'Neill and G Möbus.
  3D determination of a MOSFET gate morphology by FIB tomography
  INST PHYS CONF SER 180 611-616, (2003). (2003).

• A. RECNIK, M. KAWASAKI, T. YAMAZAKI, G. MöBUS, K. WATANABE, M. SHIOJIRI.
  QUANTITATIVE HAADF-STEM ANALYSIS OF Sb-rich INVERSION BOUNDARIES IN ZINC OXIDE
  Proceedings MCEM, Pula, Croatia, in press, (2003)

• A. RECNIK,G. MöBUS, S. ŠTURM
  REAL-SPACE PROCESSING OF SCANNING TRANSMISSION ELECTRON MICROSCOPY IMAGES
  Proceedings MCEM, Pula, Croatia, in press, (2003)

• A. RECNIK,G. MöBUS, S. ŠTURM
  Quantitative HAADF-STEM image analysis using IMAGE-WARP processing
  Microscopy & Microanalysis, 9, Issue S03, 52-53 (2003).

• G. Möbus.
  Analytical Electron Tomography for Materials Science
  Microscopy & Analysis (UK), 94, 7-9 (2003).

• B.J. Inkson, M.S. Bobji, G. Möbus, O. Kraft, T. Wagner
  TEM characterisation of nanoindentation deformation in Cu-Ti thin films sectioned by FIB.
  Proceedings ICEM-15, Durban, SA, 1 , 1021 (2002).

• Aleksander Recnik, G. Möbus, and Masahiro Kawasaki.
  Image Warp - Real Space Processing of Atomic Scale HAADF STEM Images.
  Proceedings ICEM-15, Durban, SA, 3 , 441 (2002).

• G. Möbus, and B.J. Inkson.
  Electron Spectroscopic Tomography
  Proceedings ICEM-15, Durban, SA, 3 , 375 (2002).

• G. Möbus, and S. Nufer.
  Nanobeam Propagation and Imaging.
  Proceedings ICEM-15, Durban, SA, 3 , 183 (2002).

• J.L. Hutchison, J.M. Titchmarsh, D.J.H. Cockayne, G. Möbus, C.J. Hetherington, R.C. Doole, F. Hosokawa, P. Hartel, and M. Haider.
  A double Cs corrected TEM/STEM.
  Proceedings ICEM-15, Durban, SA, 3 , 25-26 (2002).

• C. Marsh, C.J.D. Hetherington, G. Möbus, D.J.H. Cockayne .
  3-D Electron Spectroscopic Imaging of Ge/Si Quantum Dots.
  Proceedings ICEM-15, Durban, SA, 1 , 55-56 (2002).

• J.L. Hutchison, J.M. Titchmarsh, D.J.H. Cockayne, G. Möbus, C.J. Hetherington, R.C. Doole, F. Hosokawa, P. Hartel, and M. Haider.
  Applications of a Cs corrected HRTEM in Materials Science'
  Microscopy & Analysis 8 (Supplement 2) 10-11 (2002).

• J.L Hutchison, J.M. Titchmarsh, D.J.H. Cockayne, G. Möbus, C.J.D. Hetherington, R.C. Doole, F. Hosokawa, P. Hartel, M. Haider.
  A Cs Corrected HRTEM: Initial Applications in Materials Science.
  JEOL News, 37E, 2-5 (2002).

• G. Möbus, and B.J. Inkson.
  Nanoscale Analytical Electron Tomography: A new Tool for the Materials Scientist
  Materials Congress 2002, London, IOM, p. 27, (2002).

• G. Möbus, and S. Nufer.
  Interpretation of Atomic Resolution EELS Signals at Interfaces
  Microscopy & Microanalysis, 7, S2, 1180-1181 (2001).

• G. Möbus.
  Light Atom Sensitivity of Quantitative HREM
  Microscopy & Microanalysis, 7, S2, 274-275 (2001).

• G. Möbus, R.E. Dunin-Burkowski, C.J.D Hetherington, J.L Hutchison.
  3D Reconstruction of Sub-nm Beam Profiles in STEM
  Microscopy & Microanalysis, 7, S2, 344-345 (2001).

• G. Möbus, and B.J. Inkson.
  Electron Spectroscopic Tomography for Materials Science
  Microscopy & Microanalysis, 7, S2, 84-85 (2001).

• B.J. Inkson, and G. Möbus.
  3D determination of grain shape in FeAl by FIB tomography
  Microscopy & Microanalysis, 7, S2, 936-937 (2001).

• G. Möbus, and B.J. Inkson.
  Towards Electron Tomography for Materials Science
  Proceed. Dreilaendertagung, Innsbruck, 1, 36 (2001).

• G. Möbus, J.M. Titchmarsh, J.L. Hutchison, C.J.D. Hetherington, R.C. Doole, D.J.H. Cockayne .
  Prospective applications for a double-Cs-corrector TEM/STEM
  Inst. Phys. Conf. Ser. 168, 27-30 (2001).

• G. Möbus, and S. Nufer.
  Is atomic resolution EELS possible?
  Inst. Phys. Conf. Ser. 168, 151 (2001).

• G. Möbus, and B.J. Inkson.
  Element Specific Nanoscale Electron Tomography
  Inst. Phys. Conf. Ser. 168, 267 (2001).

• R M Langford, B.J. Inkson, G. Möbus, and J. M. Titchmarsh.
  3D Reconstruction from a Sequential Set of 2D Focused Ion Beam Cross-sections
  Inst. Phys. Conf. Ser. 135, 135 (2001).

2000

• G. Möbus, A. Trampert, B.J. Inkson
  Analysis of Heterointerface Superstructures using HREM and Image Processing
  Materials Congress 2000, Cirencester, p. 19 (2000).

• G. Möbus .
  EMS for STEM and applications.
  In L. Frank and F. Ciampor, editors, Proceedings EUREM 12, Brno, volume I, pages 385--386. CSEM , Brno, CZ, (2000).

• A. Levay, G. Möbus, V. Vitek, M. Rühle, and G. Tichy.
  Interpretation of HREM-images of projected 3D misfit dislocation networks using a combined molecular statics and multislice approach.
  In L. Frank and F. Ciampor, editors, Proceedings EUREM 12, Brno, volume P, pages 443--444. CSEM , Brno, CZ, (2000).

1999

• G. Möbus and O. Kienzle.
  Probability calculus for HREM structure retrieval: From maximum entropy to R-Factor refinement.
  Proc. of EMAG 99, Sheffield, p. 263--266, IOP-Publ., Bristol, UK, (1999).

• T. Gemming and G. Möbus.
  Thermal diffuse scattering and the HREM contrast mismatch problem: An update.
  Proc. of EMAG 99, Sheffield, p. 287--290, IOP-Publ., Bristol, UK (1999).

• G. Möbus.
  50 years of Scherzer Focus: Criteria for focus selection today.
  Optik , 110-S8 , 36 (1999).

• T. Gemming and G. Möbus.
  Multislice calculations of thermal diffuse (phonon) scattering.
  Optik, 110-S8 ,13 (1999).

• O. Kienzle, F. Ernst, and G. Möbus.
  HRTEM structure retrieval and error analysis by the multiple units method.
  Optik, 110-S8 , 75 (1999).

• Vitek V, A. Levay, G. Möbus, M. Rühle, and G. Tichy.
  Atomic level studies of dislocation networks in niobium-sapphire interfaces.
  Mater Sci Forum, 294-2, 199--202, (1999).

1998

• G. Möbus and O. Kienzle.
  Probability calculus for HREM structure retrieval problems.
  Proc. of ICEM-14, Cancun/Mexico (IOP-publ., Bristol, UK), 1, 607--608, (1998).

• G. Möbus, M. Hÿtch, B. Inkson, T. Wagner, and M. Rühle.
  Determination of the coherency level of hetero-interfaces by HREM.
  Proc. of ICEM-14, Cancun/Mexico (IOP-publ., Bristol, UK) , 1, 159--160, (1998).

• G. Möbus and T. Gemming.
  On the use of CBED -derived and ab-initio scattering factors to check for chemical bonding sensitive imaging conditions in HREM.
  Proc. of ICEM-14, Cancun/Mexico (IOP-publ., Bristol, UK), 1 , 123--124, (1998).

• G. Möbus, A. Weickenmeier, J. Marien, T. Gemming, S. Krämer, J. Mayer, S. Köstlmeier, and C. Elsässer.
  A CBED study of sapphire substrate quality with respect to HREM applications.
  Proc. of ICEM-14, Cancun/Mexico (IOP-publ., Bristol, UK), 3, 771--772, (1998).

• O. Kienzle, F. Ernst, and G. Möbus .
  Error analysis in HRTEM structure retrieval by multiple unit analysis.
  Proc. of ICEM-14, Cancun/Mexico (IOP-publ., Bristol, UK), 1, 627--628, (1998).

1997

• G. Möbus, R. Schweinfest, S. Bernath, and T. Wagner.
  Iterative structure retrieval techniques for aperiodic defects (e.g. dislocations) using QHREM.
  Microscopy and Microanalysis, 3, S2 ,679, (1997).

• G. Möbus, T. Gemming, W. Nüchter, M. Exner, P. Gumbsch, A. Weickenmeier, M. Wilson, and M. Rühle.
  Are common atom form factors in HREM -simulations accurate enough for quantitative image matching?
  Microscopy and Microanalysis, 3, S2, 1159, (1997).

• G. Möbus.
  Wahrscheinlichkeitstheoretische Konzepte zur atomaren Defektstrukturbestimmung mittels HREM.
  Europ. J. of cell biology , 74, S45 ,18, (1997).

• B.J. Inkson, G. Möbus, and M. Rühle.
  Atomic-resolution electron microscopy of $TiB_2$ precipitates in an industrial TiAl alloy.
  MRS Symp. Proc., Boston, 466, in press, (1997).

1996

• G. Möbus, T. Gemming, R. Schweinfest, O. Kienzle, T. Höche, and M. Rühle.
  A modular program package for structure retrieval of crystal defects by iterative digital image matching in HREM.
  Proc. EUREM'96, Dublin , 1 ,I 396--397; directory T14 on CDROM, (1996).

• G. Möbus, T. Gemming, P. Gumbsch, and M. Rühle.
  A molecular dynamics approach to thermal diffuse scattering in quantitative HREM.
  Proc. EUREM'96, Dublin, 1 ,I 382--383; directory T14 on CDROM, (1996).

• T. Gemming, M. Exner, M. Wilson, G. Möbus, and M. Rühle.
  Ab-initio electron charge density calculations coupled to crystal scattering factors for quantitative HREM of sapphire.
  Proc. EUREM'96, Dublin, 1 ,I 400--401; directory T14 on CDROM, (1996).

• R. Schweinfest, F. Ernst, G. Möbus, and T. Wagner.
  Structure of the $Al/MgAl_2O_4$ interface determined by quantitative HRTEM.
  Proc. EUREM'96, Dublin , 2 ,II 644--645, directory M12 on CDROM, (1996).

• G. Möbus.
  Monte-Carlo estimations for the precision of iterative structure refinement in QHREM.
  Proc. of 54nd annual meeting of MSA, Minneapolis, pages 100--101, (1996).

1995

• G. Möbus, G. Dehm, G. Gutekunst, and M. Rühle.
  Problems in interpreting sub-Å-resolution images studied by simulated evolution based digital image matching.
  Proc. of 53nd annual meeting of MSA, Kansas City , page 638, (1995).

• G. Möbus.
  Musterklassifizierung und Musterinterpretation in der digitalen Bildanalyse von HREM-Grenzflächenabbildungen.
  Optik, 100-S6 , 53, (1995).

1994

• F. Phillipp, R. Höschen, G. Möbus, M. Osaki, and M. Rühle.
  The Stuttgart atomic resolution high-voltage electron microscope: approaching 1 Å point-to-point resolution.
  JEOL news, 31E, 2, (1994).

• G. Möbus, F. Phillipp, and M. Rühle.
  Verification of sub-\AA information transfer and influence on the precision of structure determination by quantitative HRTEM.
  Proc. of 52nd annual meeting of MSA, New Orleans, page 748, (1994).

• G. Möbus and F. Ernst.
  Determination of interface structures by quantitative interpretation of HREM images.
  Proc. Autumn School, Int. Center of Electr. Microsc. Halle(Saale), page 61, (1994).

• G. Möbus, G. Gutekunst, J. Mayer, and M. Rühle.
  High precision iterative digital image matching and limitations of quantitative HRTEM.
  Proc. 13th Int. Congr. Electron Microscopy, Paris, 1, 373, (1994).

• C. Gatts, G. Möbus, T. Höche, and M. Rühle.
  Using artificial neural networks for pattern recognition in HRTEM.
  Proc. 13th Int. Congr. Electron Microscopy, Paris , 1 ,491, (1994).

• T. Geipel, S.Q. Xiao, G. Möbus, and P. Pirouz.
  Application of the adaptive filtering technique to HRTEM investigations of $60^o$ dislocations in Ge.
  Proc. 13th Int. Congr. Electron Microscopy, Paris, 1, 431, (1994).

• G. Möbus, F. Phillipp, and M. Rühle.
  Influence of high-voltage-high-resolution electron microscopy on the structure determination of interfaces.
  Proc. of 46th Meeting of SCANDEM, Kuopio, Finland, page 24, (1994).

1993

• G. Möbus, G. Necker, and M. Rühle.
  Ein iteratives digitales Bildvergleichsverfahren zur exakten Simulation von Grauwerten in Gitterabbildungen höchster Auflösung.
  Optik, 94-S5, p. 53, (1993).

1992

• G. Möbus, G. Necker, and M. Rühle.
  An adaptive Fourier filtering technique for quantitative HRTEM of interfaces.
  H. Heydenreich and W. Neumann, editors, Proc. Autumn School on Image Interpr. and Image Proc. in Electr. Micr., page 80. MPI für Mikrostrukturphysik, Halle/Saale , (1992).

• G. Möbus, G. Necker, and M. Rühle.
  An adaptive Fourier analysis of HRTEM images containing defects.
  Proceedings of the Xth European Congress on Electron Microscopy, page 529. University of Granada, Spain, (1992).

• G. Möbus, M. Hohenstein, F. Phillipp, F. Ernst, G. Necker, and M. Rühle.
  A procedure to measure the chromatic contrast transfer envelope of high resolution electron microscopes.
  Proceedings of the Xth European Congress on Electron Microscopy, page 531. University of Granada, Spain, (1992).

• W. Mader, F. Ernst, and G. Möbus.
  HRTEM of interfaces in crystalline solids.
  Proceedings of the Xth European Congress on Electron Microscopy, page 477. University of Granada, Spain, (1992).

• D. Hofmann, G. Möbus, and F. Ernst.
  Quantitative HRTEM of incoherent twin boundaries in copper.
  Proceedings of the Xth European Congress on Electron Microscopy, page 513. University of Granada, Spain, (1992).

1991

• J. Mayer, J.C.H. Spence, and G. Möbus.
  Two-dimensional OMEGA energy-filtered CBED on the new Zeiss EM912.
  Proceedings of the 49th Annual Meeting of the EMSA, page 786. San Francisco Press, (1991).